完整後設資料紀錄
| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.author | Huang, YC | en_US |
| dc.contributor.author | Wey, WS | en_US |
| dc.date.accessioned | 2014-12-08T15:44:13Z | - |
| dc.date.available | 2014-12-08T15:44:13Z | - |
| dc.date.issued | 2001-02-01 | en_US |
| dc.identifier.issn | 1057-7130 | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/82.917790 | en_US |
| dc.identifier.uri | http://hdl.handle.net/11536/29862 | - |
| dc.description.abstract | A delta-sigma (Delta Sigma) modulator has been traditionally analyzed by assuming its reference to be constant, but practically the reference may be interfered and thus vary with time. For an interfered reference modulator, the performance of quantization noise is degraded by quantization noise leakage due to interfered feedback. In this paper, a systematic study for observing the behavior of a second-order modulator with an interfered references is presented, based on a linear modeling, spectral analysis, and beharioral simulations. An analytical form of the output of a a Delta Sigma modulator with an interfered feedback is obtained and compared with behavioral simulation. Due to the agreement between the theoretical calculation and the behavioral simulation results, it is concluded that the quantization noise leakage should be considered for describing the behavior of the Delta Sigma modulators more precisely. | en_US |
| dc.language.iso | en_US | en_US |
| dc.subject | analog-to-digital converter (ADC) | en_US |
| dc.subject | delta-sigma modulation | en_US |
| dc.subject | interfered reference | en_US |
| dc.subject | quantization noise | en_US |
| dc.subject | quantization noise leakage | en_US |
| dc.subject | sigma-delta modulation | en_US |
| dc.subject | varying reference | en_US |
| dc.title | Second-order delta-sigma modulation with interfered reference | en_US |
| dc.type | Article | en_US |
| dc.identifier.doi | 10.1109/82.917790 | en_US |
| dc.identifier.journal | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING | en_US |
| dc.citation.volume | 48 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 192 | en_US |
| dc.citation.epage | 197 | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.identifier.wosnumber | WOS:000168234100010 | - |
| dc.citation.woscount | 1 | - |
| 顯示於類別: | 期刊論文 | |

