標題: | LINEAR DEPENDENCY CHECK IN BUILT-IN TEST |
作者: | YANG, C 資訊管理與財務金融系 註:原資管所+財金所 Department of Information Management and Finance |
公開日期: | 1-四月-1993 |
摘要: | Given a characteristic polynomial p(x) and a sampling polynomial with respect to p(x), a designer likes to know whether the sampling polynomial is a dependency polynomial. A dependency polynomial gives low fault coverage in the built-in self test. The tool LDC computes the residue combinations of the factors in the set polynomial and advises designers if the sampling polynomial covers all the testing space. When the sampling polynomial is a dependency polynomial, LDC will try to find one, if any, independent polynomial at a minimum cost. In cases of short test vectors LDC can exhaustively enumerate all independent polynomials for the designers to choose from. This paper reviews the basics of the linear dependency computation, explains the LDC capabilities and its usefulness, and discusses the computational issues of the problem. |
URI: | http://hdl.handle.net/11536/3079 |
ISSN: | 0026-2714 |
期刊: | MICROELECTRONICS AND RELIABILITY |
Volume: | 33 |
Issue: | 5 |
起始頁: | 633 |
結束頁: | 636 |
顯示於類別: | 期刊論文 |