標題: Common-path heterodyne interferometric detection scheme for measuring wavelength shift
作者: Lee, JY
Su, DC
光電工程學系
Department of Photonics
關鍵字: wavelength shift;heterodyne interferometry
公開日期: 1-四月-1999
摘要: When a linearly polarized light passes through a uniaxial crystal, small wavelength shifts will introduce phase difference variations between s- and p-polarizations, These phase difference variations can be measured accurately by heterodyne interferometry. Based on these facts, a common-path heterodyne interferometric detection scheme for measuring wavelength shift is proposed. This scheme has the advantages of both common-path interferometry and heterodyne interferometry. (C) 1999 Elsevier Science B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/S0030-4018(99)00074-7
http://hdl.handle.net/11536/31439
ISSN: 0030-4018
DOI: 10.1016/S0030-4018(99)00074-7
期刊: OPTICS COMMUNICATIONS
Volume: 162
Issue: 1-3
起始頁: 7
結束頁: 10
顯示於類別:期刊論文


文件中的檔案:

  1. 000079947000002.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。