標題: | Common-path heterodyne interferometric detection scheme for measuring wavelength shift |
作者: | Lee, JY Su, DC 光電工程學系 Department of Photonics |
關鍵字: | wavelength shift;heterodyne interferometry |
公開日期: | 1-四月-1999 |
摘要: | When a linearly polarized light passes through a uniaxial crystal, small wavelength shifts will introduce phase difference variations between s- and p-polarizations, These phase difference variations can be measured accurately by heterodyne interferometry. Based on these facts, a common-path heterodyne interferometric detection scheme for measuring wavelength shift is proposed. This scheme has the advantages of both common-path interferometry and heterodyne interferometry. (C) 1999 Elsevier Science B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/S0030-4018(99)00074-7 http://hdl.handle.net/11536/31439 |
ISSN: | 0030-4018 |
DOI: | 10.1016/S0030-4018(99)00074-7 |
期刊: | OPTICS COMMUNICATIONS |
Volume: | 162 |
Issue: | 1-3 |
起始頁: | 7 |
結束頁: | 10 |
顯示於類別: | 期刊論文 |