Dielectric breakdown patterns and active walker model

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Sheu, CR	en_US
dc.contributor.author	Cheng, CY	en_US
dc.contributor.author	Pan, RP	en_US
dc.date.accessioned	2019-04-03T06:39:17Z	-
dc.date.available	2019-04-03T06:39:17Z	-
dc.date.issued	1999-02-01	en_US
dc.identifier.issn	1063-651X	en_US
dc.identifier.uri	http://dx.doi.org/10.1103/PhysRevE.59.1540	en_US
dc.identifier.uri	http://hdl.handle.net/11536/31528	-
dc.description.abstract	Simulations based on the active walker model an used successfully to reconstruct the dielectric breakdown patterns observed in a cell with parallel-plate electrodes. Different types of patterns can be obtained with suitable parameters. These parameters correspond to the electrical and environmental conditions during the breakdown.	en_US
dc.language.iso	en_US	en_US
dc.title	Dielectric breakdown patterns and active walker model	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1103/PhysRevE.59.1540	en_US
dc.identifier.journal	PHYSICAL REVIEW E	en_US
dc.citation.volume	59	en_US
dc.citation.issue	2	en_US
dc.citation.spage	1540	en_US
dc.citation.epage	1544	en_US
dc.contributor.department	電子物理學系	zh_TW
dc.contributor.department	Department of Electrophysics	en_US
dc.identifier.wosnumber	WOS:000078779500035	en_US
dc.citation.woscount	13	en_US
顯示於類別：	期刊論文

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