標題: Dielectric breakdown patterns and active walker model
作者: Sheu, CR
Cheng, CY
Pan, RP
電子物理學系
Department of Electrophysics
公開日期: 1-二月-1999
摘要: Simulations based on the active walker model an used successfully to reconstruct the dielectric breakdown patterns observed in a cell with parallel-plate electrodes. Different types of patterns can be obtained with suitable parameters. These parameters correspond to the electrical and environmental conditions during the breakdown.
URI: http://dx.doi.org/10.1103/PhysRevE.59.1540
http://hdl.handle.net/11536/31528
ISSN: 1063-651X
DOI: 10.1103/PhysRevE.59.1540
期刊: PHYSICAL REVIEW E
Volume: 59
Issue: 2
起始頁: 1540
結束頁: 1544
顯示於類別:期刊論文


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