標題: | Long electron dephasing length and disorder-induced spin-orbit coupling in indium tin oxide nanowires |
作者: | Hsu, Yao-Wen Chiu, Shao-Pin Lien, An-Shao Lin, Juhn-Jong 電子物理學系 物理研究所 Department of Electrophysics Institute of Physics |
公開日期: | 15-十一月-2010 |
摘要: | We have measured the quantum-interference magnetoresistances in two single indium tin oxide (ITO) nanowires between 0.25 and 40 K, by using the four-probe configuration method. The magnetoresistances are compared with the one-dimensional weak-(anti)localization theory to extract the electron dephasing length L(phi). We found, in a 60-nm-diameter nanowire with a low resistivity of rho(10 K) =185 mu Omega cm, that L(phi) is long, increasing from 150 nm at 40 K to 520 nm at 0.25 K. Therefore, the nanowire reveals strict one-dimensional weak-localization effect up to several tens of degrees of kelvin. In a second 72-nm-diameter nanowire with a high resistivity of rho(10 K)=1030 mu Omega cm, the dephasing length is suppressed to L(phi)(0.26 K)=200 nm, and thus a crossover of the effective device dimensionality from one to three occurs at about 12 K. In particular, disorder-induced spin-orbit coupling is evident in the latter sample, manifesting weak-antilocalization effect at temperatures below similar to 4 K. These observations demonstrate that versatile quantum-interference effects can be realized in ITO nanowires by controlling differing levels of atomic defects and impurities. |
URI: | http://dx.doi.org/10.1103/PhysRevB.82.195429 http://hdl.handle.net/11536/31932 |
ISSN: | 1098-0121 |
DOI: | 10.1103/PhysRevB.82.195429 |
期刊: | PHYSICAL REVIEW B |
Volume: | 82 |
Issue: | 19 |
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顯示於類別: | 期刊論文 |