Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ker, Ming-Dou | en_US |
dc.contributor.author | Yen, Cheng-Cheng | en_US |
dc.date.accessioned | 2014-12-08T15:48:09Z | - |
dc.date.available | 2014-12-08T15:48:09Z | - |
dc.date.issued | 2010-10-01 | en_US |
dc.identifier.issn | 0278-0046 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TIE.2009.2039456 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/32110 | - |
dc.description.abstract | A new transient detection circuit for on-chip protection design against system-level electrical-transient disturbance is proposed in this paper. The circuit function to detect positive or negative electrical transients under system-level electrostatic-discharge (ESD) and electrical-fast-transient (EFT) testing conditions has been investigated by HSPICE simulation and verified in silicon chip. The experimental results in a 0.18-mu m complementary-metal-oxide-semiconductor (CMOS) process have confirmed that the new proposed on-chip transient detection circuit can successfully memorize the occurrence of system-level electrical-transient disturbance events. The output of the proposed on-chip transient detection circuit can be used as a firmware index to execute the system recovery procedure. With hardware/firmware codesign, the transient disturbance immunity of microelectronic products equipped with CMOS integrated circuits under system-level ESD or EFT tests can be significantly improved. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Electrical-fast-transient (EFT) test | en_US |
dc.subject | electromagnetic compatibility | en_US |
dc.subject | electrostatic discharge (ESD) | en_US |
dc.subject | system-level ESD test | en_US |
dc.subject | transient detection circuit | en_US |
dc.title | New Transient Detection Circuit for On-Chip Protection Design Against System-Level Electrical-Transient Disturbance | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TIE.2009.2039456 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | en_US |
dc.citation.volume | 57 | en_US |
dc.citation.issue | 10 | en_US |
dc.citation.spage | 3533 | en_US |
dc.citation.epage | 3543 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000283256000031 | - |
dc.citation.woscount | 4 | - |
Appears in Collections: | Articles |
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