完整后设资料纪录
DC 栏位语言
dc.contributor.authorLee, Zwei-Meien_US
dc.contributor.authorWang, Cheng-Yehen_US
dc.contributor.authorWu, Jieh-Tsorngen_US
dc.date.accessioned2014-12-08T15:05:23Z-
dc.date.available2014-12-08T15:05:23Z-
dc.date.issued2007-10-01en_US
dc.identifier.issn0018-9200en_US
dc.identifier.urihttp://dx.doi.org/10.1109/JSSC.2007.905293en_US
dc.identifier.urihttp://hdl.handle.net/11536/3930-
dc.description.abstractA 15-bit 125-MS/s two-channel time-interleaved pipelined ADC is fabricated in a 0.18 mu m CMOS technology, and achieves 91.9 dB SFDR, 69.9 dB SNDR for a 9.99 MHz input. This ADC incorporates a single sample-and-hold amplifier which employs a precharged circuit configuration to mitigate performance requirements for its opamp. Digital background calibration is applied to maintain the conversion linearity of each A/D channel and also correct both gain and offset mismatches between the two channels. Excluding I/O buffers, the chip occupies an area of 4.3 x 4.3 mm(2) and dissipates 909 mW from a 1.8 V supply.en_US
dc.language.isoen_USen_US
dc.subjectanalog-digital conversionen_US
dc.subjectcalibrationen_US
dc.subjectsample and hold circuitsen_US
dc.titleA CMOS 15-bit 125-MS/s time-interleaved ADC with digital background calibrationen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1109/JSSC.2007.905293en_US
dc.identifier.journalIEEE JOURNAL OF SOLID-STATE CIRCUITSen_US
dc.citation.volume42en_US
dc.citation.issue10en_US
dc.citation.spage2149en_US
dc.citation.epage2160en_US
dc.contributor.department电子工程学系及电子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000249959300010-
显示于类别:Conferences Paper


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