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dc.contributor.authorTZUANG, CKCen_US
dc.contributor.authorCHEN, CDen_US
dc.contributor.authorPENG, STen_US
dc.date.accessioned2014-12-08T15:05:25Z-
dc.date.available2014-12-08T15:05:25Z-
dc.date.issued1990-12-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/22.64558en_US
dc.identifier.urihttp://hdl.handle.net/11536/3953-
dc.description.abstractWe present a novel and accurate full-wave mode-matching approach to analyze the dispersion characteristics of millimeter-wave and microwave transmission lines with finite conductivity, metallization thickness, and holding grooves. The approach is quite general but only the results for a unilateral finline are presented. The accuracy of the solution depends primarily on the correct and complete description of eigenfunction expansions in each of the uniform (stratified) or nonuniform layer regions. The latter consists of metallized strips of finite conductivity, which in turn produce the so-called metal modes (eigenmodes). The metal mode exists in the metallized region with high conductivity for the most part and decays sharply in the air region. Without incorporating the metal modes, the convergence studies will fail and the accuracy of the field theory solution deteriorates. Since the accuracy of the present approach is established, the composite effects of the finite conductivity and metallization thickness can be studied rigorously. A numerical limiting case analysis shows that the mode conversion between the dominant finline mode and the dielectric-slab-loaded waveguide mode may happen through the reduction of the metallization thickness. The theoretical results for the dispersion parameters of the dominant mode propagation constant and the characteristic impedance are reported. The effects of the conductor losses using various metallizing materials are also presented.en_US
dc.language.isoen_USen_US
dc.titleFULL-WAVE ANALYSIS OF LOSSY QUASI-PLANAR TRANSMISSION-LINE INCORPORATING THE METAL MODESen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/22.64558en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume38en_US
dc.citation.issue12en_US
dc.citation.spage1792en_US
dc.citation.epage1799en_US
dc.contributor.department傳播研究所zh_TW
dc.contributor.department電信研究中心zh_TW
dc.contributor.departmentInstitute of Communication Studiesen_US
dc.contributor.departmentCenter for Telecommunications Researchen_US
dc.identifier.wosnumberWOS:A1990EQ45600002-
dc.citation.woscount14-
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