ORIGIN OF THE ENHANCEMENT OF NEGATIVE DIFFERENTIAL RESISTANCE AT LOW-TEMPERATURES IN DOUBLE-BARRIER RESONANT TUNNELING STRUCTURES

標題:	ORIGIN OF THE ENHANCEMENT OF NEGATIVE DIFFERENTIAL RESISTANCE AT LOW-TEMPERATURES IN DOUBLE-BARRIER RESONANT TUNNELING STRUCTURES
作者:	WU, JS CHANG, CY LEE, CP WANG, YH KAI, F 電控工程研究所 Institute of Electrical and Control Engineering
公開日期:	1-Jul-1989
URI:	http://dx.doi.org/10.1109/55.29659 http://hdl.handle.net/11536/4336
ISSN:	0741-3106
DOI:	10.1109/55.29659
期刊:	IEEE ELECTRON DEVICE LETTERS
Volume:	10
Issue:	7
起始頁:	301
結束頁:	303
Appears in Collections:	Articles

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