A VERTICAL KELVIN TEST STRUCTURE FOR MEASURING THE TRUE SPECIFIC CONTACT RESISTIVITY

標題:	A VERTICAL KELVIN TEST STRUCTURE FOR MEASURING THE TRUE SPECIFIC CONTACT RESISTIVITY
作者:	LEI, TF LEU, LY LEE, CL 交大名義發表電控工程研究所 National Chiao Tung University Institute of Electrical and Control Engineering
公開日期:	1-Apr-1986
URI:	http://hdl.handle.net/11536/4754
ISSN:	0741-3106
期刊:	IEEE ELECTRON DEVICE LETTERS
Volume:	7
Issue:	4
起始頁:	259
結束頁:	261
Appears in Collections:	Articles

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