MOBILITY MODELS FOR THE IV CHARACTERISTICS OF BURIED-CHANNEL MOSFETS

標題:	MOBILITY MODELS FOR THE IV CHARACTERISTICS OF BURIED-CHANNEL MOSFETS
作者:	WU, CY HSU, KC 交大名義發表電控工程研究所 National Chiao Tung University Institute of Electrical and Control Engineering
公開日期:	1985
URI:	http://hdl.handle.net/11536/4804
ISSN:	0038-1101
期刊:	SOLID-STATE ELECTRONICS
Volume:	28
Issue:	9
起始頁:	917
結束頁:	923
顯示於類別：	期刊論文