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dc.contributor.authorGUO, SFen_US
dc.date.accessioned2014-12-08T15:06:23Z-
dc.date.available2014-12-08T15:06:23Z-
dc.date.issued1983en_US
dc.identifier.issn0013-4651en_US
dc.identifier.urihttp://hdl.handle.net/11536/4946-
dc.language.isoen_USen_US
dc.titleNUMERICAL-ANALYSIS OF SILICON SCHOTTKY-BARRIER CONTACTSen_US
dc.typeMeeting Abstracten_US
dc.identifier.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETYen_US
dc.citation.volume130en_US
dc.citation.issue8en_US
dc.citation.spageC325en_US
dc.citation.epageC325en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1983RC47600332-
dc.citation.woscount0-
顯示於類別:期刊論文