完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | GUO, SF | en_US |
dc.date.accessioned | 2014-12-08T15:06:23Z | - |
dc.date.available | 2014-12-08T15:06:23Z | - |
dc.date.issued | 1983 | en_US |
dc.identifier.issn | 0013-4651 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/4946 | - |
dc.language.iso | en_US | en_US |
dc.title | NUMERICAL-ANALYSIS OF SILICON SCHOTTKY-BARRIER CONTACTS | en_US |
dc.type | Meeting Abstract | en_US |
dc.identifier.journal | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | en_US |
dc.citation.volume | 130 | en_US |
dc.citation.issue | 8 | en_US |
dc.citation.spage | C325 | en_US |
dc.citation.epage | C325 | en_US |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:A1983RC47600332 | - |
dc.citation.woscount | 0 | - |
顯示於類別: | 期刊論文 |