NUMERICAL-ANALYSIS OF SILICON SCHOTTKY-BARRIER CONTACTS

Full metadata record

DC Field	Value	Language
dc.contributor.author	GUO, SF	en_US
dc.date.accessioned	2014-12-08T15:06:23Z	-
dc.date.available	2014-12-08T15:06:23Z	-
dc.date.issued	1983	en_US
dc.identifier.issn	0013-4651	en_US
dc.identifier.uri	http://hdl.handle.net/11536/4946	-
dc.language.iso	en_US	en_US
dc.title	NUMERICAL-ANALYSIS OF SILICON SCHOTTKY-BARRIER CONTACTS	en_US
dc.type	Meeting Abstract	en_US
dc.identifier.journal	JOURNAL OF THE ELECTROCHEMICAL SOCIETY	en_US
dc.citation.volume	130	en_US
dc.citation.issue	8	en_US
dc.citation.spage	C325	en_US
dc.citation.epage	C325	en_US
dc.contributor.department	電控工程研究所	zh_TW
dc.contributor.department	Institute of Electrical and Control Engineering	en_US
dc.identifier.wosnumber	WOS:A1983RC47600332	-
dc.citation.woscount	0	-
Appears in Collections:	Articles