圖形化藍寶石基板缺陷檢測之研究

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DC Field	Value	Language
dc.contributor.author	張嘉原	en_US
dc.contributor.author	Chang, Chia-Yuan	en_US
dc.contributor.author	洪紹剛	en_US
dc.contributor.author	Hung, Shao-Kang	en_US
dc.date.accessioned	2014-12-12T02:00:27Z	-
dc.date.available	2014-12-12T02:00:27Z	-
dc.date.issued	2011	en_US
dc.identifier.uri	http://140.113.39.130/cdrfb3/record/nctu/#GT079969510	en_US
dc.identifier.uri	http://hdl.handle.net/11536/50816	-
dc.description.abstract	本研究主要目的為設計一光學檢查系統, 針對圖形化藍寶石基板上的瑕疵檢測出來, 並加以分類以利後續製程。在設計光學檢測系統中, 需先完成基本的影像處理功能, 如二值化, 直方圖, ROI 形態學處理, 以及邊緣檢測的基本功能。本研究利用 Boland C++ 5.0 做為程式撰寫工具,開發出影像處理的基本功能, 且透過實際的CCD 拍攝影像來判斷, 並修改核心參數以達到最適化, 主要的研究環境, 程式都可以轉移到將來的自動化生產,以改善LED 的製造成本。	zh_TW
dc.description.abstract	An optical inspection system for PSS is designed in this thesis. Before this inspection system, some basic image processing functions shall be implemented first , like thresholding , histogram , morphology , and edge detection. Boland C++ 5.0 is the programming tool used for image processing. By taking the real PSS image for inspection, we can optimize the parameter. Also, we can transfer this research to factory automation to reduce the cost and mass production.	en_US
dc.language.iso	zh_TW	en_US
dc.subject	缺陷檢測	zh_TW
dc.subject	視覺	zh_TW
dc.subject	Defects Inspection	en_US
dc.subject	Vision	en_US
dc.title	圖形化藍寶石基板缺陷檢測之研究	zh_TW
dc.title	Inspection of Patterned Sapphire Substrate Defects	en_US
dc.type	Thesis	en_US
dc.contributor.department	工學院精密與自動化工程學程	zh_TW
Appears in Collections:	Thesis

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