PRE-EPITAXIAL AND POST-EPITAXIAL GETTERING OF STACKING-FAULTS IN SILICON

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DC Field	Value	Language
dc.contributor.author	CHEN, MC	en_US
dc.contributor.author	SILVESTRI, VJ	en_US
dc.date.accessioned	2014-12-08T15:06:32Z	-
dc.date.available	2014-12-08T15:06:32Z	-
dc.date.issued	1979	en_US
dc.identifier.issn	0013-4651	en_US
dc.identifier.uri	http://hdl.handle.net/11536/5106	-
dc.language.iso	en_US	en_US
dc.title	PRE-EPITAXIAL AND POST-EPITAXIAL GETTERING OF STACKING-FAULTS IN SILICON	en_US
dc.type	Meeting Abstract	en_US
dc.identifier.journal	JOURNAL OF THE ELECTROCHEMICAL SOCIETY	en_US
dc.citation.volume	126	en_US
dc.citation.issue	8	en_US
dc.citation.spage	C368	en_US
dc.citation.epage	C368	en_US
dc.contributor.department	工學院	zh_TW
dc.contributor.department	College of Engineering	en_US
dc.identifier.wosnumber	WOS:A1979HH39300597	-
dc.citation.woscount	0	-
Appears in Collections:	Articles

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