標題: A hybrid scheme for compacting test responses with unknown values
作者: Chao, Mango C. -T.
Cheng, Kwang-Ting
Wang, Seongmoon
Chakradhar, Srimat T.
Ei, Wen-Long V.
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2007
摘要: This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature Registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults.
URI: http://hdl.handle.net/11536/6246
ISBN: 978-1-4244-1381-2
ISSN: 1063-6757
期刊: IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2
起始頁: 513
結束頁: 519
Appears in Collections:Conferences Paper