標題: | A hybrid scheme for compacting test responses with unknown values |
作者: | Chao, Mango C. -T. Cheng, Kwang-Ting Wang, Seongmoon Chakradhar, Srimat T. Ei, Wen-Long V. 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 2007 |
摘要: | This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature Registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults. |
URI: | http://hdl.handle.net/11536/6246 |
ISBN: | 978-1-4244-1381-2 |
ISSN: | 1063-6757 |
期刊: | IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2 |
起始頁: | 513 |
結束頁: | 519 |
顯示於類別: | 會議論文 |