标题: 应用Kappa分析法评估目视人员检验之一致性
Applying Kappa Analysis Method in Assessing the Attribute Agreement of Inspectors-A case study of a Semiconductor Testing House
作者: 施国伟
Shih, Kuo-Wei
唐丽英
Tong, Lee-Ing
管理学院工业工程与管理学程
关键字: 量测系统分析;误警率;失误率;目视检查;MSA;False Alarm Rate;Miss Rate;Visual Inspection
公开日期: 2012
摘要: 随着国际市场的竞争日趋激烈,客户对品质的要求也更趋严格,必须靠精准的量测系统,才能保证产品于制程中及出货品质的可靠性,对于需要高度仰赖人工目视检验产品的产业而言,如何判定目视检验人员对判定产品好坏之能力是项非常重要的问题,因此本研究以计数型GO/NOGO量测系统分析(Measurement System Analysis)MSA为主题,应用Kappa分析法针对一个半导体测试厂,将目视人员检验结果透过Kappa分析法之交叉表计算出Kappa值,以探讨目视人员彼此间对相同产品之品质特性进行好坏判定时,其判定结果的一致性,以及探讨各目视人员判定结果对标准值之一致性与有效性,进而了解误警率(将好的判定成不好的机率)及失误率(将不好的判定成好的机率),最后依据判定准则确认误判风险是否可被接受,同时从分析中了解训练目视人员时所需加强之方向,并给予不合格人员适当的教育训练。
本研究最后以新竹科学园区某半导体测试厂为例,来说明本研究方法之有效性,研究成果可提供业者作为判定目视检查人员对产品好坏判定之一致性与正确性能力之风险管理的参考,以期提高目视人员检验水准、减少误判、有效拦阻不合格品流出及降低内外部品质成本损失,使企业在管理检验人员变异及训练上有一套具体的做法。
Due to the serious competition of the international market, requirements of product /process quality from customers are increasing rapidly. Consequently, on the precise measuring system to ensure the product/process quality depends the Semiconductor manufactories which particularly needs precise visual inspection to ensure their product quality, therefore evaluating the agreement among inspectors, This study develops a procedure of assessing the attribute agreement of inspectors using Kappa becomes important analysis method. Finally, a case of IC testing house in Hsin-chu, Taiwan is utilized to demonstrate the effectiveness of the proposed method. The result of this study can be utilized by Semiconductor manufactories to assess their inspectors’ skills. it can also be employed as risk management. In addition, the results of this study can be utilized to reduce the quality lost of a process and to develop a useful method of improving inspector’s skills.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT070063310
http://hdl.handle.net/11536/72132
显示于类别:Thesis