完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 詹倉嘉 | en_US |
dc.contributor.author | Chang-Chia Chan | en_US |
dc.contributor.author | 許錫美 | en_US |
dc.contributor.author | His-Mei Hsu | en_US |
dc.date.accessioned | 2014-12-12T02:49:56Z | - |
dc.date.available | 2014-12-12T02:49:56Z | - |
dc.date.issued | 2007 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#GT009263516 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/77606 | - |
dc.description.abstract | 記憶體產業自2007年底開始面臨記憶體供過於求、價格快速滑落的窘境,而造成記憶體測試廠測試價格遭大幅砍價,進而影響獲利能力,並且縮減資本支出,在資金有限情況下,停止擴充自有的測試產能。因此,如何充份利用自有測試廠生產資源,獲得最大的利潤,使得測試產能規劃更形重要。 近年來在國內以記憶體測試廠為研究對象的論文,主要的研究主題大多在於作業層級的排程派工,皆未完整探討測試機台的跨機問題,及機台產值與訂單的相依的特性。測試產能規劃對測試廠重要性增加,本研究針對此部份進行研究,提出一個適合記憶體測試廠的短期產能規劃模組,在廠內各測試機型、測試配件和外包廠產能的限制下,最大化利潤為目標,以指派各客戶訂單的生產途程至適宜的機型。 | zh_TW |
dc.description.abstract | In this study, we propose a capacity planning model for memory IC final testing company in a make-to-order (MTO) production system. A special characteristic in the production line is that the revenue for a particular job is based on which types of machine to operating it. And machine hourly rates for each type vary with customers. Therefore, to maximize the operating profits for a given set of orders is considered in this study. Under the constraints of machine capacity and tooling, for maximizing the operating profit of a given set of orders, a linear programming is formulated to determine the operating machine type for each job. Based on this model, we can also determine the numbers of machine for each type to be provided by outsourcing company. Finally, we illustrate a near real case to explain the application of the proposed model and to show its performances. | en_US |
dc.language.iso | zh_TW | en_US |
dc.subject | 最終測試 | zh_TW |
dc.subject | 產能規劃 | zh_TW |
dc.subject | 線性規劃 | zh_TW |
dc.subject | Final Test | en_US |
dc.subject | Capacity Planning | en_US |
dc.subject | Linear Programming | en_US |
dc.title | 記憶體測試廠短期最終測試產能規劃模式之構建 | zh_TW |
dc.title | A Short-term Final Test Capacity Planning Model for Memory Testing Company | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 管理學院工業工程與管理學程 | zh_TW |
顯示於類別: | 畢業論文 |