光子晶體線缺陷波導與邊射型雷射整合研究

Full metadata record

DC Field	Value	Language
dc.contributor.author	吳居倫	en_US
dc.contributor.author	李建平	en_US
dc.date.accessioned	2014-12-12T02:51:39Z	-
dc.date.available	2014-12-12T02:51:39Z	-
dc.date.issued	2005	en_US
dc.identifier.uri	http://140.113.39.130/cdrfb3/record/nctu/#GT009311558	en_US
dc.identifier.uri	http://hdl.handle.net/11536/78029	-
dc.description.abstract	我們成功地利用電子束微影系統(E-beam Lithography)與電感偶合電漿乾式蝕刻(Inductive Coupled Plasma Etching；ICP)在GaAs晶片上整合製作光子晶體線缺陷波導與邊射型雷射；本論文利用雷射L-I曲線、輸出頻譜以及近場發光圖形討論了不同偶合結構的偶合效率、對於邊射型雷射特性的影響以及在光子晶體線缺陷波導內的損耗。將雷射光源與光子晶體線缺陷波導整合於單一晶片上可以讓其他光子晶體元件容易整合，同時對於未來積體光學的發展有很大的助益。	zh_TW
dc.language.iso	zh_TW	en_US
dc.subject	光子晶體	zh_TW
dc.subject	半導體雷射	zh_TW
dc.subject	Photonic Crystal	en_US
dc.subject	Semiconductor Laser	en_US
dc.title	光子晶體線缺陷波導與邊射型雷射整合研究	zh_TW
dc.title	Integration of Photonic Crystal Line Defect Waveguide and Edge-Emitting Laser	en_US
dc.type	Thesis	en_US
dc.contributor.department	電子研究所	zh_TW
Appears in Collections:	Thesis