標題: TFT-LCD製程重工決策之研究
Rework Decisions for TFT-LCD Manufacturing Process
作者: 盧威豪
Wei-Hao Lu
巫木誠
Muh-Chern Wu
工業工程與管理學系
關鍵字: 薄膜液晶顯示器;重工決策;基因演算法;TFT-LCD;Rework Decision;Genetic Algorithm
公開日期: 2005
摘要: 在TFT-LCD產業中,無論是Array製程所製作的薄膜電晶體基板(TFT基板)或是CF製程所製作的彩色濾光片基板(CF基板),通常皆被設計為可切割成數個面板,切割數依顯示器應用產品需求不同而有所不同。因為新製程導入階段,製程良率會偏低,所以一般而言,TFT-LCD廠會在Array製程及CF製程階段中,於某些作業與作業中間加設檢測站,依據基板上所包含的良好面板個數,來決定此基板是否可繼續加工或是逕行報廢再加以重工,但如何訂定良好面板個數的門檻值,也就是如何訂定重工決策(rework decision),是目前TFT-LCD廠經常面臨的一個決策問題。有鑑於過去研究的不足,以及目前工業界多採用直覺性的思考來訂定各檢測站的重工決策,並未考量到整體績效,且並非站在整個生產系統的觀點來訂定,所以本研究建構一數學模式,考量範圍包含整個TFT-LCD廠生產流程中Array製程、CF製程及Cell製程的特性,以產品的獲利(profit)最大化為目標,利用基因演算法,針對不同的產品,訂定個別產品在Array製程及CF製程階段中,各檢測站的最佳重工決策。
In the manufacturing of TFT-LCD, the array process is for producing TFT-plates, the CF (color filter) process is for CF-plates, and the cell process is for assembling a TFT plate with a CF plate to form a single one—called TFT-LCD plate. A TFT/CF plate is composed of several panels and so is an assembled TFT-LCD plate. A TFT-LCD panel is good only when its two composing panels are good. In the ramp-up stage of manufacturing TFT-LCD, the yields of array/CF processes may be so low that many panels on a plate are defect ones. Two questions might be raised: Should we hold the manufacturing of a low-yield plate and send it to rework? If so, how to determine the threshold values for rework? This research mathematically formulates the rework decision problem and develops a genetic algorithm to solve the problem. Experiment results indicate that the proposed method significantly outperforms the heuristic method used in industry.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT009333517
http://hdl.handle.net/11536/79477
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