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dc.contributor.author賴文駿en_US
dc.contributor.authorWen-Chen Laien_US
dc.contributor.author鄭裕庭en_US
dc.contributor.authorY. T. Chengen_US
dc.date.accessioned2014-12-12T03:03:10Z-
dc.date.available2014-12-12T03:03:10Z-
dc.date.issued2006en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT009411701en_US
dc.identifier.urihttp://hdl.handle.net/11536/80613-
dc.description.abstract在這篇論文裡,主要是研究退火的效應對螺旋式電感的影響,在30分鐘還有600度C的退火溫度操作下,發現銅大約有7.4%的電阻值下降,但是對於同樣製作在同一片晶片上的電感而言,電感感值幾乎沒有發生變化。十組3.5圈的螺旋式電感中,退火前後的電感感值差異有- 2.25%到0.41%的變化,同時共振頻率有- 8.22%到1.68%的變化。對於這樣的改變,我們利用統計學上的方法來做檢定,檢定的結果認為此變化會來自於實驗的誤差,事實上退火效應對電感是不會造成影響。而這樣的結果也顯示導電率與螺旋式電感感值沒有相關性,此研究符合Greenhouse電感感值公式的預測,而非Chen et al.的模型。zh_TW
dc.description.abstractIn At this paper, thermal annealing effect on the inductor performance has been investigated. 30 mins. 600□C thermal annealing performed to have ~7.4% electrical resistivity reduction of Cu film won’t result in any inductance variance of on-chip spiral inductor that made of the same Cu. For a total of 18 3.5-circles on-chip spiral inductors, the inductance variance before and after the thermal anneal only ranges from -2.25% to 0.41%. Meanwhile, the resonant frequency associated with the inductance variance also changes from -8.22% to 1.68%. According to hypothesis test statistical method, it shows that these variances are not correlated which can be attributed to experimental variation and there is, in fact, no thermal annealing effect on the inductor performance. The results also indicate that the electrical conductivity is independent of the inductance of on-chip spiral inductor which is matched with the prediction of Greenhouse model but totally contradicts with the model proposed by Chen et al..en_US
dc.language.isoen_USen_US
dc.subject退火zh_TW
dc.subject電感zh_TW
dc.subject螺旋zh_TW
dc.subjectannealen_US
dc.subjectinductoren_US
dc.subjectinductanceen_US
dc.subjectresonanten_US
dc.subjectresistivityen_US
dc.subjectstatisticalen_US
dc.title退火效應對螺旋式電感感值變化之研究zh_TW
dc.titleThe Investigation of Annealing Effect on the Inductance Variance of On-Chip Spiral Inductoren_US
dc.typeThesisen_US
dc.contributor.department電子研究所zh_TW
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