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dc.contributor.authorChao, Hao-Mingen_US
dc.contributor.authorWuen, Wen-Shenen_US
dc.contributor.authorWen, Kuei-Annen_US
dc.date.accessioned2014-12-08T15:10:41Z-
dc.date.available2014-12-08T15:10:41Z-
dc.date.issued2008-11-01en_US
dc.identifier.issn0018-9480en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMTT.2008.2004900en_US
dc.identifier.urihttp://hdl.handle.net/11536/8169-
dc.description.abstractIn this paper, an active guarding circuit is presented for wideband substrate noise suppression. A feed-forward compensation mechanism is proposed to extend the noise suppression bandwidth and to adjust the amplitude of phase-inversed noise cancellation current by introducing a zero and an amplitude controller. A noise decoupling mechanism is developed to provide a decoupling path and to sense the noise level for generating noise cancellation current. With substrate characterization, parameters of substrate network impedance, decoupling factor, and amplitude of noise cancellation current can be either obtained or determined. The active guarding circuit is implemented in a 90-nm CMOS process based on substrate characterization. The measured substrate noise suppression is better than -9 dB from dc to 250 MHz. The -3-dB suppression bandwidth is effectively extended to 1.2 GHz. The power consumption and circuit area are 2.5 mW and 20 mu m x 41 mu m, respectively.en_US
dc.language.isoen_USen_US
dc.subjectAnalog circuitsen_US
dc.subjectCMOS integrated circuits (ICs)en_US
dc.subjectsubstrate coupling noiseen_US
dc.subjectsubstrate crosstalken_US
dc.subjectsubstrate isolationen_US
dc.titleAn Active Guarding Circuit Design for Wideband Substrate Noise Suppressionen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TMTT.2008.2004900en_US
dc.identifier.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESen_US
dc.citation.volume56en_US
dc.citation.issue11en_US
dc.citation.spage2609en_US
dc.citation.epage2619en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department友訊交大聯合研發中心zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentD Link NCTU Joint Res Ctren_US
dc.identifier.wosnumberWOS:000261009300010-
dc.citation.woscount1-
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