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單晶片系統驗證之核心技術開發---子計畫六:針對先進晶片設計的熱點驗證之完整熱模型與高效能熱分析(II)
單晶片系統驗證之核心技術開發---子計畫六:針對先進晶片設計的熱點驗證之完整熱模型與高效能熱分析(II)
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Date
2006
Authors
李育民
LEE YU-MIN
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https://www.grb.gov.tw/search/planDetail?id=1279623&docId=234489
https://ir.lib.nycu.edu.tw/handle/11536/89356
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