| 標題: | 遠場下確認次波長尺度變化的方法之研發(II) Development of the Characterization Schemes of Subwavelength Variation from Far-Field Characteristics (II) |
| 作者: | 陳志隆 CHERN JYH-LONG 交通大學光電工程研究所 |
| 公開日期: | 2006 |
| 官方說明文件#: | NSC95-2221-E009-293 |
| URI: | http://hdl.handle.net/11536/89676 https://www.grb.gov.tw/search/planDetail?id=1309582&docId=242007 |
| Appears in Collections: | Research Plans |
- 遠場下確認次波長尺度變化的方法之研發(I) / 陳志隆;CHERN JYH-LONG
- Characterization of one-dimension edge roughness from far-field irradiance at subwavelength-scale precision / Chu, Shu-Chun;Chern, Jyh-Long
- 利用遠場特徵回溯次波長尺度變化及提升其量測靈敏度之探討 / 朱淑君;Shu-Chun Chu;陳志隆;Jyh-Long Chern
- Characterization of the signature of subwavelength variation from far-field irradiance / Chu, SC;Chern, JL
- Retrieving two-dimensional information of the subwavelength variation from far-field irradiance / Chu, Shu-Chun;Chern, Jyh-Long
- Characterization of Subwavelength Plastic Fiber Utilizing Terahertz Time-Domain Spectroscopy / You, Borwen;Liu, Tze-An;Peng, Jin-Long;Pan, Ci-Ling;Lu, Ja-Yu
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