運用掃描式探針顯微鏡研製與分析矽奈米電子元件(II)

Full metadata record

DC Field	Value	Language
dc.contributor.author	許鉦宗	en_US
dc.contributor.author	SHEU JENG TZONG	en_US
dc.date.accessioned	2014-12-13T10:31:56Z	-
dc.date.available	2014-12-13T10:31:56Z	-
dc.date.issued	2004	en_US
dc.identifier.govdoc	NSC93-2215-E009-080	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/91236	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=1027499&docId=195424	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	運用掃描式探針顯微鏡研製與分析矽奈米電子元件(II)	zh_TW
dc.title	Fabrication and Characterization of Silicon Nanoelectronic Devices with Scanning Probe Microscope(II)	en_US
dc.type	Plan	en_US
dc.contributor.department	國立交通大學奈米科技研究所	zh_TW
Appears in Collections:	Research Plans

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