Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 李崇仁 | en_US |
| dc.date.accessioned | 2014-12-13T10:33:23Z | - |
| dc.date.available | 2014-12-13T10:33:23Z | - |
| dc.date.issued | 2003 | en_US |
| dc.identifier.govdoc | NSC92-2220-E009-002 | zh_TW |
| dc.identifier.uri | http://hdl.handle.net/11536/92032 | - |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=844240&docId=159988 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.language.iso | zh_TW | en_US |
| dc.title | 對以智財單元為基系統晶片設計之驗證與測試技術開發研究---總計畫 | zh_TW |
| dc.title | Verification, Testing and Diagnosis Technology Exploitation for IP-Based SoC Design | en_US |
| dc.type | Plan | en_US |
| dc.contributor.department | 國立交通大學電子工程學系 | zh_TW |
| Appears in Collections: | Research Plans | |
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