標題: Highly reliable integrated amorphous silicon thin film transistors gate driver
作者: Liu, Chin-Wei
Tai, Ya-Hsiang
光電工程學系
Department of Photonics
公開日期: 2007
摘要: A reliable shift register consisted of amorphous silicon thin film transistors (a-Si TFTs) is proposed for scan driver circuit of active matrix liquid crystal display (AMLCD). The lifetime of proposed circuit is evaluated based on the reliability measurement data of the a-Si TFTs used and it is estimated to over 5000 hours. Therefore, a highly reliable scanning circuit can be achieved.
URI: http://hdl.handle.net/11536/9257
ISBN: 978-957-28522-4-8
期刊: IDMC'07: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2007
起始頁: 519
結束頁: 522
Appears in Collections:Conferences Paper