晶圓探測站之視覺自動導引探測系統

Full metadata record

DC Field	Value	Language
dc.contributor.author	林錫寬	en_US
dc.contributor.author	LIN SHIR-KUAN	en_US
dc.date.accessioned	2014-12-13T10:35:09Z	-
dc.date.available	2014-12-13T10:35:09Z	-
dc.date.issued	2002	en_US
dc.identifier.govdoc	NSC91-2622-E009-021-CC3	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/93251	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=733298&docId=138539	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	晶圓探測站之視覺自動導引探測系統	zh_TW
dc.title	Vision-Based Automatic Probing System for Wafer Probe Station	en_US
dc.type	Plan	en_US
dc.contributor.department	交通大學電機與控制工程系	zh_TW
Appears in Collections:	Research Plans