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dc.contributor.author陳明哲en_US
dc.contributor.authorCHEN MING-JERen_US
dc.date.accessioned2014-12-13T10:36:56Z-
dc.date.available2014-12-13T10:36:56Z-
dc.date.issued1999en_US
dc.identifier.govdocNSC88-2215-E009-047zh_TW
dc.identifier.urihttp://hdl.handle.net/11536/94272-
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=418223&docId=74194en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.language.isozh_TWen_US
dc.subject穿隧洩漏電流zh_TW
dc.subject靜電放電zh_TW
dc.subject金氧半場效電晶體zh_TW
dc.subject深次微米zh_TW
dc.subject鎖定zh_TW
dc.subject快閃式記憶體zh_TW
dc.subjectTunneling leakage currenten_US
dc.subjectESDen_US
dc.subjectMOSFETen_US
dc.subjectDeep submicrometeren_US
dc.subjectLatch-upen_US
dc.subjectFlash memoryen_US
dc.title深次微米MOSFET穿隧漏電流、鎖定及靜電放電之研究zh_TW
dc.titleTunneling Leakage, Latch-up and ESD in Deep Submicron MOSFET'sen_US
dc.typePlanen_US
dc.contributor.department交通大學電子工程研究所zh_TW
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