标题: Characterization of one-dimension edge roughness from far-field irradiance at subwavelength-scale precision
作者: Chu, Shu-Chun
Chern, Jyh-Long
光电工程学系
Department of Photonics
关键字: diffraction;subwavelength;measurement
公开日期: 15-四月-2008
摘要: It is proposed and numerically verified that the one-dimensional edge roughness of test sample can be characterized by far-field irradiance measurement at subwavelength-scale precision with a constructed aperture playing as an optical ruler. The precision of the proposed scheme of measurement could be better than 3%, even when the edge roughness is in subwavelength-scale. The influence of sample thickness on the proposed measurement scheme is also investigated and considered. (C) 2007 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.optcom.2007.12.032
http://hdl.handle.net/11536/9450
ISSN: 0030-4018
DOI: 10.1016/j.optcom.2007.12.032
期刊: OPTICS COMMUNICATIONS
Volume: 281
Issue: 8
起始页: 1997
结束页: 2001
显示于类别:Articles


文件中的档案:

  1. 000254566000015.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.