| 標題: | 積層式氧化鋅變阻器衰化現象之研究 The Study of Degradation Phenomena of Multilayer ZnO Varistor |
| 作者: | 曾俊元 TSEUNG-YUENTSENG 國立交通大學電子工程學系 |
| 關鍵字: | 積層式氧化鋅變阻器;衰化;深陷能階;Multilayer chip ZnO varistor;Degradation;Deep level transient spectroscopy |
| 公開日期: | 1996 |
| 官方說明文件#: | NSC85-2216-E009-011 |
| URI: | http://hdl.handle.net/11536/95816 https://www.grb.gov.tw/search/planDetail?id=207091&docId=36607 |
| 顯示於類別： | 研究計畫 |
- Degradation phenomena of multilayer ZnO-glass varistors studied by deep level transient spectroscopy / Wang, YP;Lee, WI;Tseng, TY
- Degradation phenomena of multilayer ZnO-glass varistors studied by deep level transient spectroscopy / Wang, YP;Lee, WI;Tseng, TY
- Defects and degradation in ZnO varistor / Lee, WI;Young, RL
- Deep level transient spectroscopy depth profile measurements of polycrystalline zinc oxide ceramic / Lee, WI;Young, RL;Chen, WK
- Deep level transient spectroscopy depth profile measurements of polycrystalline zinc oxide ceramic / Lee, WI;Young, RL;Chen, WK
- 積層式氧化鋅變阻器之製備與電性研究 / 顏安建;Ann-Jeng Yen;曾俊元;Tseung-Yuen Tseng
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