Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chen, Jung-Sheng | en_US |
dc.contributor.author | Ker, Ming-Dou | en_US |
dc.date.accessioned | 2014-12-08T15:12:29Z | - |
dc.date.available | 2014-12-08T15:12:29Z | - |
dc.date.issued | 2008-03-01 | en_US |
dc.identifier.issn | 0916-8524 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1093/ietele/e91-c.3.378 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/9593 | - |
dc.description.abstract | The MOS switch with bootstrapped technique is widely used in low-voltage switched-capacitor circuit. The switched-capacitor circuit with the bootstrapped technique could be a dangerous design approach in the nano-scale CMOS process due to the gate-oxide transient overstress. The impact of gate-oxide transient overstress on MOS switch in switched-capacitor circuit is investigated in this work with the sample-and-hold amplifier (SHA) in a 130-nm CMOS process. After overstress on the MOS switch of SHA with unity-gain buffer, the circuit performances in time domain and frequency domain are measured to verify the impact of gate-oxide reliability on circuit performances. The oxide breakdown on switch device degrades the circuit performance of bootstrapped switch technique. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | gate-oxide reliability | en_US |
dc.subject | sample-and-hold amplifier | en_US |
dc.subject | dielectric breakdown | en_US |
dc.subject | bootstrapped switch | en_US |
dc.subject | switched-capacitor circuit | en_US |
dc.title | Circuit performance degradation of switched-capacitor circuit with bootstrapped technique due to gate-oxide overstress in a 130-nm CMOS process | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1093/ietele/e91-c.3.378 | en_US |
dc.identifier.journal | IEICE TRANSACTIONS ON ELECTRONICS | en_US |
dc.citation.volume | E91C | en_US |
dc.citation.issue | 3 | en_US |
dc.citation.spage | 378 | en_US |
dc.citation.epage | 384 | en_US |
dc.contributor.department | 電機學院 | zh_TW |
dc.contributor.department | College of Electrical and Computer Engineering | en_US |
dc.identifier.wosnumber | WOS:000254605600017 | - |
dc.citation.woscount | 0 | - |
Appears in Collections: | Articles |
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