標題: A test and diagnosis methodology for RF transceivers
作者: Chen, Hung-kai
Su, Chauchin
電控工程研究所
Institute of Electrical and Control Engineering
關鍵字: RF test;RF design-for-testability;mixer;low noise amplifier;transceiver
公開日期: 2007
摘要: This paper proposes an RF test and diagnosis methodology based on digital DFT structure and built-in DSP function of a SoC Chip. Constellation variation plots are proposed to identify the faulty component. Furthermore, linear interpolation is used to determine the amount of variation. The simulated test results show that the method is able to identify not only the faulty component but also the variation amount precise.
URI: http://hdl.handle.net/11536/9900
http://dx.doi.org/10.1109/ATS.2007.29
ISBN: 978-0-7695-2890-8
ISSN: 1081-7735
DOI: 10.1109/ATS.2007.29
期刊: PROCEEDINGS OF THE 16TH ASIAN TEST SYMPOSIUM
起始頁: 135
結束頁: 138
Appears in Collections:Conferences Paper


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