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國立陽明交通大學機構典藏
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公開日期
標題
作者
2007
Effect of UV illumination on inverted-staggered a-Si : H thin film transistors
Li, Yiming
;
Lou, Jen-Chung
;
Chen, Chung-Le
;
Hwang, Chih-Hong
;
Yan, Shuoting
;
電信工程研究所
;
Institute of Communications Engineering
2009
Electrical Characteristics of Nanoscale Multi-Fin Field Effect Transistors with Different Fin Aspect Ratio
Cheng, Hui-Wen
;
Hwang, Chih-Hong
;
Li, Yiming
;
電信工程研究所
;
Institute of Communications Engineering
15-七月-2009
The geometric effect and programming current reduction in cylindrical-shaped phase change memory
Li, Yiming
;
Hwang, Chih-Hong
;
Li, Tien-Yeh
;
Cheng, Hui-Wen
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-十二月-2008
High-Frequency Characteristic Fluctuations of Nano-MOSFET Circuit Induced by Random Dopants
Li, Yiming
;
Hwang, Chih-Hong
;
電信工程研究所
;
Institute of Communications Engineering
1-五月-2010
The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit
Han, Ming-Hung
;
Li, Yiming
;
Hwang, Chih-Hong
;
傳播研究所
;
電機工程學系
;
Institute of Communication Studies
;
Department of Electrical and Computer Engineering
1-六月-2008
Large-scale "atomistic" approach to discrete-dopant-induced characteristic fluctuations in silicon nanowire transistors
Li, Yiming
;
Hwang, Chih-Hong
;
Huang, Hsuan-Ming
;
電信工程研究所
;
Institute of Communications Engineering
2010
Large-Scale Atomistic Circuit-Device Coupled Simulation of Discrete-Dopant-Induced Characteristic Fluctuation in Nano-CMOS Digital Circuits
Li, Yiming
;
Hwang, Chih-Hong
;
電信工程研究所
;
Institute of Communications Engineering
2007
Numerical simulation of nanoscale multiple-gate devices including random impurity effect
Hwang, Chih-Hong
;
Li, Yiming
;
電信工程研究所
;
Institute of Communications Engineering
2007
Numerical simulation of static noise margin for a six-transistor static random access memory cell with 32nm fin-typed field effect transistors
Li, Yiming
;
Hwang, Chih-Hong
;
Yu, Shao-Ming
;
電信工程研究所
;
Institute of Communications Engineering
2009
Process- and Random-Dopant-Induced Characteristic Variability of SRAM with nano-CMOS and Bulk FinFET Devices
Li, Tien-Yeh
;
Hwang, Chih-Hong
;
Li, Yiming
;
電信工程研究所
;
Institute of Communications Engineering
1-二月-2010
Process-Variation Effect, Metal-Gate Work-Function Fluctuation, and Random-Dopant Fluctuation in Emerging CMOS Technologies
Li, Yiming
;
Hwang, Chih-Hong
;
Li, Tien-Yeh
;
Han, Ming-Hung
;
傳播研究所
;
電機工程學系
;
Institute of Communication Studies
;
Department of Electrical and Computer Engineering
2009
Process-Variation- and Random-Dopant-Induced Static Noise Margin Fluctuation in Nanoscale CMOS and FinFET SRAM Cells
Li, Tien-Yeh
;
Hwang, Chih-Hong
;
Li, Yiming
;
電信工程研究所
;
Institute of Communications Engineering
1-三月-2009
Process-variation- and random-dopants-induced threshold voltage fluctuations in nanoscale planar MOSFET and bulk FinFET devices
Li, Yiming
;
Hwang, Chih-Hong
;
Cheng, Hui-Wen
;
電信工程研究所
;
Institute of Communications Engineering
2009
Propagation Delay Dependence on Channel Fins and Geometry Aspect Ratio of 16-nm Multi-Gate MOSFET Inverter
Cheng, Hui-Wen
;
Hwang, Chih-Hong
;
Li, Yiming
;
電信工程研究所
;
Institute of Communications Engineering
1-八月-2009
Random-Dopant-Induced Variability in Nano-CMOS Devices and Digital Circuits
Li, Yiming
;
Hwang, Chih-Hong
;
Li, Tien-Yeh
;
電信工程研究所
;
Institute of Communications Engineering
2008
Reduction of Discrete-Dopant-Induced High-Frequency Characteristic Fluctuations in Nanoscale CMOS Circuit
Li, Yiming
;
Hwang, Chih-Hong
;
Yeh, Ta-Ching
;
Huang, Hsuan-Ming
;
Li, Tien-Yeh
;
Cheng, Hui-Wen
;
電信工程研究所
;
Institute of Communications Engineering
5-三月-2010
Simulation of characteristic variation in 16 nm gate FinFET devices due to intrinsic parameter fluctuations
Li, Yiming
;
Hwang, Chih-Hong
;
Han, Ming-Hung
;
傳播研究所
;
電機工程學系
;
Institute of Communication Studies
;
Department of Electrical and Computer Engineering
2009
Statistical Analysis of Metal Gate Workfunction Variability, Process Variation, and Random Dopant Fluctuation in Nano-CMOS Circuits
Hwang, Chih-Hong
;
Li, Tien-Yeh
;
Han, Ming-Hung
;
Lee, Kuo-Fu
;
Cheng, Hui-Wen
;
Li, Yiming
;
傳播研究所
;
Institute of Communication Studies
1-五月-2010
Statistical variability in FinFET devices with intrinsic parameter fluctuations
Hwang, Chih-Hong
;
Li, Yiming
;
Han, Ming-Hung
;
傳播研究所
;
電機工程學系
;
Institute of Communication Studies
;
Department of Electrical and Computer Engineering
1-九月-2008
Temperature dependence on the contact size of GeSbTe films for phase change memories
Li, Yiming
;
Yu, Shao-Ming
;
Hwang, Chih-Hong
;
Kuo, Yi-Ting
;
資訊工程學系
;
電信工程研究所
;
Department of Computer Science
;
Institute of Communications Engineering