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公開日期標題作者
1-十二月-2004CoTiO3 high-kappa, dielectrics on HSG for DRAM applicationsChao, TS; Ku, WM; Lin, HC; Landheer, D; Wang, YY; Mori, Y; 奈米中心; Nano Facility Center
1980CURRENT GAIN OF HIGH-LOW JUNCTION EMITTER BIPOLAR-TRANSISTOR STRUCTURE WITH UNIFORMLY DOPED PROFILESWU, CY; 電控工程研究所; 奈米中心; Institute of Electrical and Control Engineering; Nano Facility Center
1980CURRENT GAIN OF THE BIPOLAR-TRANSISTORWU, CY; 電控工程研究所; 奈米中心; Institute of Electrical and Control Engineering; Nano Facility Center
12-五月-1997Effect of adding Ar on the thermal stability of chemical vapor deposited fluorinated silicon oxide using an indirect fluorinating precursorChang, KM; Wang, SW; Li, CH; Yeh, TH; Yang, JY; 奈米中心; Nano Facility Center
1-九月-2007Effect of channel-width widening on a poly-Si thin-film transistor structure in the linear regionChang, Kow-Ming; Lin, Gin-Ming; 電子工程學系及電子研究所; 奈米中心; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center
1-十一月-2004Effect of fluoroalkyl substituents on the reactions of alkylchlorosilanes with mold surfaces for nanoimprint lithographyChen, JK; Ko, FH; Hsieh, KF; Chou, CT; Chang, FC; 材料科學與工程學系奈米科技碩博班; 應用化學系; 奈米中心; Graduate Program of Nanotechnology , Department of Materials Science and Engineering; Department of Applied Chemistry; Nano Facility Center
1-五月-1996Effect of Ge incorporation on the performance of p-channel polycrystalline Si1-xGex thin-film transistorsLin, HC; Lin, HY; Chang, CY; 電控工程研究所; 奈米中心; Institute of Electrical and Control Engineering; Nano Facility Center
1-七月-2014Effect of Low Temperature Ge Seed Layer and Post Thermal Annealing on Quality of Ge1-xSix (0.05 <= x <= 0.1) Graded Buffer Layers by UHV-CVDChi-Lang Nguyen; Nguyen Hong Quan; Binh-Tinh Tran; Su, Yung-Hsuan; Tang, Shih-Hsuan; Luo, Guang-Li; Chang, Edward-Yi; 材料科學與工程學系; 電子工程學系及電子研究所; 奈米中心; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center
29-一月-1996Effect of rapid thermal annealing on the electrical and physical properties of metalorganic chemical-vapor-deposited TiNSun, SC; Tsai, MH; 奈米中心; Nano Facility Center
1-四月-2001Effect of temperature and illumination on the instability of a-Si : H thin-film transistors under AC gate bias stressHuang, CY; Teng, TH; Yang, CJ; Tseng, CH; Cheng, HC; 奈米中心; Nano Facility Center
1-三月-1995EFFECTS OF COBALT SILICIDATION ON THE ELECTRICAL CHARACTERISTICS OF SHALLOW P(+)N JUNCTIONS FORMED BY BF2+ IMPLANTATION INTO THIN POLYCRYSTALLINE SI FILMSLIN, CT; CHAO, CH; JUANG, MH; JAN, ST; CHOU, PF; CHENG, HC; 奈米中心; Nano Facility Center
1-十二月-1993THE EFFECTS OF H-2-O-2-PLASMA TREATMENT ON THE CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORSCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; 奈米中心; 次微米人才培訓中心; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center; CTR SUBMICRON PROFESS TRAINING
1-一月-1997Effects of NH3 plasma passivation on N-channel polycrystalline silicon thin-film transistorsCheng, HC; Wang, FS; Huang, CY; 奈米中心; Nano Facility Center
1-一月-1997Effects of NH3 plasma passivation on N-channel polycrystalline silicon thin-film transistorsCheng, HC; Wang, FS; Huang, CY; 奈米中心; Nano Facility Center
1-五月-1995EFFECTS OF PRESSURE ON THE FORMATION OF PHOSPHORUS-DOPED MICROCRYSTALLINE SILICON FILMS DEPOSITED BY RADIO-FREQUENCY GLOW-DISCHARGEFENG, MS; LIANG, CW; 材料科學與工程學系; 電子工程學系及電子研究所; 奈米中心; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center
15-二月-1993ELLIPSOMETRY STUDY ON REFRACTIVE-INDEX PROFILES OF THE SIO2/SI3N4/SIO2/SI STRUCTURETIEN, SC; CHUNG, LL; TAN, FL; 電子工程學系及電子研究所; 奈米中心; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center
2015ENGINEERED THRESHOLD VOLTAGE IN ALGAN/GAN HEMTS FOR NORMALLY-OFF OPERATIONTsai, Jung-Ruey; Chang, Yi-Sheng; Wei, Kuo-Shu; Wen, Ting-Ting; 奈米中心; Nano Facility Center
29-二月-2000Evaluation of cleaning efficiency with a radioactive tracer and development of a microwave digestion method for semiconductor processesLu, JK; Ko, FH; Chu, TC; Sun, YC; Wang, MY; Wang, TK; 奈米中心; Nano Facility Center
1999Evaluation of impurity migration and microwave digestion methods for lithographic materialsKo, FH; Hsiao, LT; Chou, CT; Wang, MY; Wang, TK; Sun, YC; Cheng, BJ; Yeng, S; Dai, BT; 奈米中心; Nano Facility Center
1-十二月-1999Evaluation of metal migration and determination of trace metals after microwave digestion for lithographic materialsKo, FH; Wang, MY; Wang, TK; 奈米中心; Nano Facility Center
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