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Issue DateTitleAuthor(s)
1-Jan-1995CHARACTERIZATION AND SIMULATION OF HOT CARRIER EFFECT ON ERASING GATE CURRENT IN FLASH EEPROMSHUANG, CM; WANG, TH; CHEN, T; PENG, NC; CHANG, A; SHONE, FC; 交大名義發表; National Chiao Tung University
1-Nov-1993DEVICE AND CIRCUIT SIMULATION OF ANOMALOUS DX TRAP EFFECTS IN DCFL AND SCFL HEMT INVERTERSWANG, TH; WU, SJ; HUANG, CM; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
1-Sep-1994EFFECTS OF HOT-CARRIER-INDUCED INTERFACE STATE GENERATION IN SUBMICRON LDD MOSFETSWANG, TH; HUANG, CM; CHOU, PC; CHUNG, SSS; CHANG, TE; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
1994INTERFACE TRAP INDUCED THERMIONIC AND FIELD EMISSION CURRENT IN OFF-STATE MOSFETSWANG, TH; CHANG, TE; HUANG, CM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Dec-1994INTERFACE-TRAP EFFECT ON GATE INDUCED DRAIN LEAKAGE CURRENT IN SUBMICRON N-MOSFETSWANG, TH; HUANG, CM; CHANG, TE; CHOU, JW; CHANG, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-1995MECHANISMS OF INTERFACE TRAP-INDUCED DRAIN LEAKAGE CURRENT IN OFF-STATE N-MOSFETSCHANG, TE; HUANG, CM; WANG, TH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Nov-1992MODELING HOT-ELECTRON GATE CURRENT IN SI MOSFETS USING A COUPLED DRIFT-DIFFUSION AND MONTE-CARLO METHODHUANG, CM; WANG, TH; CHEN, CN; CHANG, MC; FU, J; 電控工程研究所; Institute of Electrical and Control Engineering
1-Dec-1995STRUCTURAL EFFECT ON BAND-TRAP-BAND TUNNELING INDUCED DRAIN LEAKAGE IN N-MOSFETSWANG, TH; CHANG, TE; HUANG, CM; YANG, JY; CHANG, KM; CHIANG, LP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-1994TERRAIN EXPLORATION OF A SENSOR-BASED ROBOT MOVING AMONG UNKNOWN OBSTACLES OF POLYGONAL SHAPECHEN, Z; HUANG, CM; 交大名義發表; 資訊科學與工程研究所; National Chiao Tung University; Institute of Computer Science and Engineering
1-Feb-1995TRANSIENT SIMULATION OF EPROM WRITING CHARACTERISTICS, WITH A NOVEL HOT-ELECTRON INJECTION MODELHUANG, CM; WANG, TH; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 10 of 10