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Showing results 1 to 7 of 7
Issue DateTitleAuthor(s)
10-Oct-2001Adaptive symmetric mean filter: A new noise-reduction approach based on the slope facet modelHuang, HC; Chen, CM; Wang, SD; Lu, HHS; 統計學研究所; Institute of Statistics
2005CF4 plasma treatment for fabricating high-performance and reliable solid-phase-crystallized poly-Si TFTsWang, SD; Lo, WH; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2005Drain/gate-voltage-dependent on-current and off-current instabilities in polycrystalline silicon thin-film transistors under electrical stressWang, SD; Chang, TY; Lo, WH; Sang, JY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2006Electrical characteristics and reliability of multi-channel polycrystalline silicon thin-film transistorsShieh, MS; Sang, JY; Chen, CY; Wang, SD; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Investigation of localized breakdown spots in thin SiO(2) using scanning capacitance microscopyWang, SD; Chang, MN; Chen, CY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-2005A novel process-compatible fluorination technique with electrical characteristic improvements of poly-Si TFTsWang, SD; Lo, WH; Chang, TY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Observation of localized breakdown spots in thin SiO2 films using scanning capacitance microscopyWang, SD; Chang, MN; Chen, CY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 7 of 7