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公開日期標題作者
2006ESC robustness of 40-V CMOS devices with/without drift implantChang, Wei-Jen; Ker, Ming-Dou; Lai, Tai-Hsiang; Tang, Tien-Hao; Su, Kuan-Cheng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006ESD protection design for CMOS integrated circuits with mixed-voltage I/O interfacesChang, Wei-Jen; Ker, Ming-Dou; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2008ESD protection design with on-chip ESD bus and high-voltage-tolerant ESD clamp circuit for mixed-voltage I/O buffersKer, Ming-Dou; Chang, Wei-Jen; 電機學院; College of Electrical and Computer Engineering
2007The impact of N-drift implant on ESD robustness of high-voltage NMOS with embedded SCR structure in 40-V CMOS processChang, Wei-Jen; Ker, Ming-Dou; Lai, Tai-Xiang; Tang, Tien-Hao; Su, Kuan-Cheng; 電機學院; College of Electrical and Computer Engineering
1-九月-2007On-chip ESD protection design for automotive vacuum-fluorescent-display (VFD) driver IC to sustain high ESD stressKer, Ming-Dou; Chang, Wei-Jen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2007Overview on ESD protection design for mixed-voltage I/O interfaces with high-voltage-tolerant power-rail ESD clamp circuits in low-voltage thin-oxide CMOS technologyKer, Ming-Dou; Chang, Wei-Jen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2017股利支付率與未來盈餘成長關係之研究張惟荏; 王淑芬; Chang, Wei-Jen; Wang, Sue-Fung; 財務金融研究所
顯示 1 到 7 筆資料，總共 7 筆