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公開日期標題作者
1-七月-1995AN ANALYTICAL MODEL FOR THE ABOVE-THRESHOLD CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORSCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-1994CORRELATION OF POLYSILICON THIN-FILM-TRANSISTOR CHARACTERISTICS TO DEFECT STATES VIA THERMAL ANNEALINGCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-1994THE EFFECTS OF FLUORINE PASSIVATION ON POLYSILICON THIN-FILM TRANSISTORSCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-1993THE EFFECTS OF H-2-O-2-PLASMA TREATMENT ON THE CHARACTERISTICS OF POLYSILICON THIN-FILM TRANSISTORSCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; 奈米中心; 次微米人才培訓中心; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center; CTR SUBMICRON PROFESS TRAINING
1-三月-1993H-2/O-2 PLASMA ON POLYSILICON THIN-FILM TRANSISTORCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-1994IMPROVEMENT OF POLYSILICON OXIDE CHARACTERISTICS BY FLUORINE INCORPORATIONCHERN, HN; LEE, CL; LEI, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
4-十二月-1995RADIATION EFFECTS ON N-CHANNEL POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORSYANG, CK; LEE, CL; LEI, TF; CHERN, HN; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 1 到 7 筆資料，總共 7 筆