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公開日期標題作者
2015A 0.6V, 1.3GHZ DYNAMIC COMPARATOR WITH CROSS-COUPLED LATCHESKuo, Bo-Jyun; Chen, Bo-Wei; Tsai, Chia-Ming; 交大名義發表; National Chiao Tung University
1-一月-2010A 3-GHz, 22-ps/dec Dynamic Comparator using Negative Resistance Combined with Input PairChen, Bo-Wei; Wang, Jen-Peng; Tsai, Chia-Ming; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2017Abnormal Dual Channel Formation Induced by Hydrogen Diffusion From SiNx Interlayer Dielectric in Top Gate a-InGaZnO TransistorsChen, Guan-Fu; Chang, Ting-Chang; Chen, Hua-Mao; Chen, Bo-Wei; Chen, Hong-Chih; Li, Cheng-Ya; Tai, Ya-Hsiang; Hung, Yu-Ju; Chang, Kuo-Jui; Cheng, Kai-Chung; Huang, Chen-Shuo; Chen, Kuo-Kuang; Lu, Hsueh-Hsing; Lin, Yu-Hsin; 交大-IBM智慧物聯網與巨量資料分析研發中心
9-一月-2017Abnormal hump in capacitance-voltage measurements induced by ultraviolet light in a-IGZO thin-film transistorsTsao, Yu-Ching; Chang, Ting-Chang; Chen, Hua-Mao; Chen, Bo-Wei; Chiang, Hsiao-Cheng; Chen, Guan-Fu; Chien, Yu-Chieh; Tai, Ya-Hsiang; Hung, Yu-Ju; Huang, Shin-Ping; Yang, Chung-Yi; Chou, Wu-Ching; 電子物理學系; 光電工程學系; Department of Electrophysics; Department of Photonics
1-二月-2018Combined Effects of Light Illumination and Various Bottom Gate Length on the Instability of Via-Contact-Type Amorphous InGaZnO Thin-Film TransistorsYang, Chung-I; Chang, Ting-Chang; Liao, Po-Yung; Chen, Bo-Wei; Chou, Wu-Ching; Chen, Guan-Fu; Huang, Shin-Ping; Zheng, Yu-Zhe; Wang, Yu-Xuan; Liu, Hsi-Wen; Lin, Chien-Yu; Lin, Yu-Shan; Lu, Ying-Hsin; Zhang, Shengdong; 電子物理學系; Department of Electrophysics
2012Design of the Multi-channel Electroencephalography-based Brain-Computer Interface with Novel Dry SensorsWu, Shang-Lin; Liao, Lun-De; Liou, Chang-Hong; Chen, Shi-An; Ko, Li-Wei; Chen, Bo-Wei; Wang, Po-Sheng; Chen, Sheng-Fu; Lin, Chin-Teng; 電控工程研究所; Institute of Electrical and Control Engineering
1-一月-2018Drain-Induced-Barrier-Lowing-Like Effect Induced by Oxygen-Vacancy in Scaling-Down via-Contact Type Amorphous InGaZnO Thin-Film TransistorsYang, Chung-I.; Chang, Ting-Chang; Liao, Po-Yung; Chen, Li-Hui; Chen, Bo-Wei; Chou, Wu-Ching; Chen, Guan-Fu; Lin, Sung-Chun; Yeh, Cheng-Yen; Tsai, Cheng-Ming; Yu, Ming-Chang; Zhang, Shengdong; 電子物理學系; Department of Electrophysics
6-三月-2017The effect of asymmetrical electrode form after negative bias illuminated stress in amorphous IGZO thin film transistorsSu, Wan-Ching; Chang, Ting-Chang; Liao, Po-Yung; Chen, Yu-Jia; Chen, Bo-Wei; Hsieh, Tien-Yu; Yang, Chung-I; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan; Chang, Kuan-Chang; Tsai, Tsung-Ming; 電子物理學系; Department of Electrophysics
10-四月-2017The effect of asymmetrical electrode form after negative bias illuminated stress in amorphous IGZO thin film transistors (vol 110, 103502, 2017)Su, Wan-Ching; Chang, Ting-Chang; Liao, Po-Yung; Chen, Yu-Jia; Chen, Bo-Wei; Hsieh, Tien-Yu; Yang, Chung-I; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan; Chang, Kuan-Chang; Tsai, Tsung-Ming; 電子物理學系; Department of Electrophysics
15-五月-2017The effect of device electrode geometry on performance after hot-carrier stress in amorphous In-Ga-Zn-O thin film transistors with different via-contact structuresLiao, Po-Yung; Chang, Ting-Chang; Chen, Yu-Jia; Su, Wan-Ching; Chen, Bo-Wei; Chen, Li-Hui; Hsieh, Tien-Yu; Yang, Chung-Yi; Chang, Kuan-Chang; Zhang, Sheng-Dong; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan; 電子物理學系; Department of Electrophysics
十二月-2016Effect of mechanical-strain-induced defect generation on the performance of flexible amorphous In-Ga-Zn-O thin-film transistorsLiao, Po-Yung; Chang, Ting-Chang; Su, Wan-Ching; Chen, Yu-Jia; Chen, Bo-Wei; Hsieh, Tien-Yu; Yang, Chung-Yi; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan; 電子物理學系; Department of Electrophysics
1-十二月-2016Effect of SiO2 Buffer Layer Thickness on Performance and Reliability of Flexible Polycrystalline Silicon TFTs Fabricated on PolyimideChen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Huang, Shin-Ping; Chen, Hua-Mao; Huang, Hui-Chun; Liao, Po-Yung; Chiang, Hsiao-Cheng; Zheng, Yu-Zhe; Yeh, Wei-Heng; Lin, Yu-Ho; Liang, Jonathan Siher; Chu, Ann-Kuo; Li, Hung-Wei; Tsai, Chih-Hung; Lu, Hsueh-Hsing; 光電工程學系; Department of Photonics
八月-2016Effects of Repetitive Mechanical Bending Strain on Various Dimensions of Foldable Low Temperature Polysilicon TFTs Fabricated on PolyimideChen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Huang, Shin-Ping; Liao, Po-Yung; Yang, Chung-Yi; Chu, Ann-Kuo; Wang, Terry Tai-Jui; Chang, Tsu-Chiang; Su, Bo-Yuan; Kuo, Su-Chun; Huang, I-Yu; 電子物理學系; Department of Electrophysics
28-一月-2012Gaming control using a wearable and wireless EEG-based brain-computer interface device with novel dry foam-based sensorsLiao, Lun-De; Chen, Chi-Yu; Wang, I-Jan; Chen, Sheng-Fu; Li, Shih-Yu; Chen, Bo-Wei; Chang, Jyh-Yeong; Lin, Chin-Teng; 資訊工程學系; 電機工程學系; 腦科學研究中心; Department of Computer Science; Department of Electrical and Computer Engineering; Brain Research Center
2016Identical Off-state Current Raise Induced by Photo-induced Schottky Barrier Lowering in a-InGaZnO4 Thin Film TransistorsChen, Hua-Mao; Chang, Ting-Chang; Liao, Po-Yung; Chiang, Hsiao-Cheng; Chen, Ching-En; Chen, Bo-Wei; Pan, Chih-Hung; Hung, Yu-Ju; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
26-六月-2017Impact of repeated uniaxial mechanical strain on flexible a-IGZO thin film transistors with symmetric and asymmetric structuresLiao, Po-Yung; Chang, Ting-Chang; Su, Wan-Ching; Chen, Bo-Wei; Chen, Li-Hui; Hsieh, Tien-Yu; Yang, Chung-Yi; Chang, Kuan-Chang; Zhang, Sheng-Dong; Huang, Yen-Yu; Chang, Hsi-Ming; Chiang, Shin-Chuan; 電子物理學系; Department of Electrophysics
31-十二月-2017Investigating degradation behaviors induced by hot carriers in the etch stop layer in amorphous InGaZnO thin film transistors with different electrode materials and structuresYang, Chung-I; Chang, Ting-Chang; Chen, Bo-Wei; Chou, Wu-Ching; Liao, Po-Yung; Lin, Sung-Chun; Yeh, Cheng-Yen; Chang, Chia-Sen; Tsai, Cheng-Ming; Yu, Ming-Chang; 電子物理學系; Department of Electrophysics
25-九月-2017Investigating degradation behaviors induced by mobile Cu ions under high temperature negative bias stress in a-InGaZnO thin film transistorsChiang, Hsiao-Cheng; Chang, Ting-Chang; Liao, Po-Yung; Chen, Bo-Wei; Tsao, Yu-Ching; Tsai, Tsung-Ming; Chien, Yu-Chieh; Yang, Yi-Chieh; Chen, Kuan-Fu; Yang, Chung-I; Hung, Yu-Ju; Chang, Kuan-Chang; Zhang, Sheng-Dong; Lin, Sung-Chun; Yeh, Cheng-Yen; 電子物理學系; Department of Electrophysics
2016Investigation of Abnormal Off-Current in p-Channel Double Diffused Drain Metal-Oxide-Semiconductor Transistors after Hot Carrier StressChen, Ching-En; Chang, Ting-Chang; Lu, Ying-Hsin; Chen, Hua-Mao; Chen, Bo-Wei; Pan, Chih-Hung; Hung, Yu-Ju; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2017Role of H2O Molecules in Passivation Layer of a-InGaZnO Thin Film TransistorsChien, Yu-Chieh; Chang, Ting-Chang; Chiang, Hsiao-Cheng; Chen, Hua-Mao; Tsao, Yu-Ching; Shih, Chih-Cheng; Chen, Bo-Wei; Liao, Po-Yung; Chu, Ting-Yang; Yang, Yi-Chieh; Hung, Yu-Ju; Tsai, Tsung-Ming; Chang, Kuan-Chang; 光電工程學系; Department of Photonics