瀏覽 的方式： 作者 Huang, Chien-Chao
顯示 1 到 7 筆資料，總共 7 筆
| 公開日期 | 標題 | 作者 |
| 1-四月-2012 | A CMOS-Compatible Poly-Si Nanowire Device with Hybrid Sensor/Memory Characteristics for System-on-Chip Applications | Chen, Min-Cheng; Chen, Hao-Yu; Lin, Chia-Yi; Chien, Chao-Hsin; Hsieh, Tsung-Fan; Horng, Jim-Tong; Qiu, Jian-Tai; Huang, Chien-Chao; Ho, Chia-Hua; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十二月-2010 | The effect of pulsed laser annealing on the nickel silicide formation | Chen, Hou-Yu; Lin, Chia-Yi; Huang, Chien-Chao; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-四月-2011 | Fabrication of High-Sensitivity Polycrystalline Silicon Nanowire Field-Effect Transistor pH Sensor Using Conventional Complementary Metal-Oxide-Semiconductor Technology | Chen, Hou-Yu; Lin, Chia-Yi; Chen, Min-Cheng; Huang, Chien-Chao; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-五月-2018 | Fabrication of High-Sensitivity Polycrystalline Silicon Nanowire Field-Effect Transistor pH Sensor Using Conventional Complementary Metal-Oxide-Semiconductor Technology (vol 50, 04DL05, 2011) | Chen, Hou-Yu; Lin, Chia-Yi; Chen, Min-Cheng; Huang, Chien-Chao; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2011 | Nickel Silicide Formation using Pulsed Laser Annealing for nMOSFET Performance Improvement | Chen, Hou-Yu; Lin, Chia-Yi; Chen, Min-Cheng; Huang, Chien-Chao; Chien, Chao-Hsin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十一月-2011 | A Novel Nanoinjection Lithography (NInL) Technology and Its Application for 16-nm Node Device Fabrication | Chen, Hou-Yu; Chen, Chun-Chi; Hsueh, Fu-Kuo; Liu, Jan-Tsai; Shy, Shyi-Long; Wu, Cheng-San; Chien, Chao-Hsin; Hu, Chenming; Huang, Chien-Chao; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2011 | Silicide Barrier Engineering Induced Random Telegraph Noise in 1Xnm CMOS Contacts | Chen, Min-Cheng; Lin, Chia-Yi; Chen, Bo-Yuan; Lin, Chang-Hsien; Huang, Guo-Wei; Huang, Chien-Chao; Ho, ChiaHua; Wang, Tahui; Hu, Chenming; Yang, Fu-Liang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
