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公開日期標題作者
1-一月-2010High Density Ni Nanocrystals Formed by Coevaporating Ni and SiO(2) Pellets for the Nonvolatile Memory Device ApplicationHu, Chih-Wei; Chang, Ting-Chang; Tu, Chun-Hao; Huang, Yu-Hao; Lin, Chao-Cheng; Chen, Min-Chen; Huang, Fon-Shan; Sze, Simon M.; Tseng, Tseung-Yuen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2010High Density Ni Nanocrystals Formed by Coevaporating Ni and SiO2 Pellets for the Nonvolatile Memory Device ApplicationHu, Chih-Wei; Chang, Ting-Chang; Tu, Chun-Hao; Huang, Yu-Hao; Lin, Chao-Cheng; Chen, Min-Chen; Huang, Fon-Shan; Sze, Simon M.; Tseng, Tseung-Yuen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2019Layout-Based Dual-Cell-Aware TestsWu, Tse-Wei; Lee, Dong-Zhen; Wu, Kai-Chiang; Huang, Yu-Hao; Chen, Ying-Yen; Chen, Po-Lin; Chern, Mason; Lee, Jih-Nung; Kao, Shu-Yi; Chao, Mango C. -T.; 資訊工程學系; 電子工程學系及電子研究所; Department of Computer Science; Department of Electronics Engineering and Institute of Electronics
1-一月-2013A Locality-Aware Dynamic Thread Scheduler for GPGPUsHuang, Yu-Hao; Tseng, Ying-Yu; Kuo, Hsien-Kai; Yen, Ta-Kan; Lai, Bo-Cheng Charles; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2017Methodology of Generating Dual-Cell-Aware TestsHuang, Yu-Hao; Lu, Ching-Ho; Wu, Tse-Wei; Nien, Yu-Teng; Chen, Ying-Yen; Wu, Max; Lee, Jih-Nung; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2016單元識別及雙單元識別測試之產生方法黃宇豪; 趙家佐; Huang, Yu-Hao; Chao, Chia-Tso; 電子研究所