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公開日期標題作者
20043D GOI CMOSFETs with novel IrO2(Hf) dual gates and high-kappa dielectric on 1P6M-0.18 mu m-CMOSYu, DS; Chin, A; Laio, CC; Lee, CF; Cheng, CF; Chen, WJ; Zhu, C; Li, MF; Yoo, WJ; McAlister, SP; Kwong, DL; 交大名義發表; National Chiao Tung University
1-四月-2006AC power loss and signal coupling in very large scale integration backend interconnectsChen, CC; Kao, HL; Liao, CC; Chin, A; McAlister, SP; Chi, CC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2005Broad-spectrum light emission at microscopic breakdown sites in metal-insulator-silicon tunnel diodesMihaychuk, JG; Denhoff, MW; McAlister, SP; McKinnon, WR; Chin, A; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004Device level characterization for energy bandgap of strain-relaxed SiGe and oxide/SiGe barrier heightHuang, CH; Yu, DS; Chin, A; Chen, WJ; McAlister, SP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-六月-2005The effect of IrO2-IrO2-Hf-LaAlO3 gate dielectric on the bias-temperature instability of 3-d GOI CMOSFETsYu, DS; Liao, CC; Cheng, CF; Chin, A; Li, MF; McAlister, SP; 奈米科技中心; Center for Nanoscience and Technology
1-四月-2006Electrical-stress effects and device modeling of 0.18-mu m RF MOSFETsKao, HL; Chin, A; Liao, CC; Chen, CC; McAlister, SP; Chi, CC; 奈米科技中心; Center for Nanoscience and Technology
20-九月-2004High performance CPW and microstrip ring resonators on silicon substratesChen, CC; Hung, BF; Chin, A; McAlister, SP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2006High work function IrxSi gates on HfAlON p-MOSFETsWu, CH; Yu, DS; Chin, A; Wang, SJ; Li, MF; Zhu, C; Hung, BE; McAlister, SP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2005High-kappa Ir/TiTaO/TaN capacitors suitable for analog IC applicationsChiang, KC; Huang, CC; Chin, A; Chen, WJ; McAlister, SP; Chiu, HF; Chen, JR; Chi, CC; 奈米科技中心; Center for Nanoscience and Technology
20-十月-2004High-performance bulk and thin-film microstrip transmission lines on VLSI-standard Si substratesChen, CC; Hung, BF; Chin, A; McAlister, SP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2003High-performance microwave coplanar bandpass and bandstop filters on Si substratesChan, KT; Chin, A; Li, MF; Kwong, DL; McAlister, SP; Duh, DS; Lin, WJ; Chang, CY; 電子工程學系及電子研究所; 電信工程研究所; Department of Electronics Engineering and Institute of Electronics; Institute of Communications Engineering
1-六月-2005High-performance poly-silicon TFTs incorporating LaAlO3 as the gate dielectricHung, BF; Chiang, KC; Huang, CC; Chin, A; McAlister, SP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Lanthanide and Ir-based dual metal-gate/HfAlON CMOS with large work-function differenceYu, DS; Chin, A; Wu, CH; Li, MF; Zhu, C; Wang, SJ; Yoo, WJ; Hung, BF; McAlister, SP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2004Light emission near 1.3 mu m using ITO-Al2O3-Si0.3Ge0.7-Si tunnel diodesLin, CY; Chin, A; Hou, YT; Li, MF; McAlister, SP; Kwong, DL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Low noise and high gain RF MOSFETs on plastic substratesKao, HL; Chin, A; Huang, CC; Hung, BF; Chiang, KC; Lai, ZM; McAlister, SP; Chi, CC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2005Low noise RF MOSFETs on flexible plastic substratesKao, HL; Chin, A; Hung, BF; Lee, CF; Lai, JM; McAlister, SP; Sarnudra, GS; Yoo, WJ; Chi, CC; 奈米科技中心; Center for Nanoscience and Technology
2003Low RF loss and noise of transmission lines on Si substrates using an improved ion implantation processChan, KT; Chin, A; McAlister, SP; Chang, CY; Tseng, C; Liang, V; Chen, JK; Chien, SC; Duh, DS; Lin, WJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Low voltage high speed SiO(2)/AlGaN/AlLaO(3)/TaN memory with good retentionChin, A; Laio, CC; Chen, C; Chiang, KC; Yu, DS; Yoo, WJ; Samudra, GS; Wang, T; Hsieh, IJ; McAlister, SP; Chi, CC; 電機學院; College of Electrical and Computer Engineering
2005Modeling RF MOSFETs after electrical stress using low-noise microstrip line layoutKao, HL; Chin, A; Lai, JM; Lee, CF; Chiang, KC; McAlister, SP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2005A novel program-erasable high-(K) A1N-Si MIS capacitorLai, CH; Chin, A; Hung, BF; Cheng, CF; Yoo, WJ; Li, MF; Zhu, CX; McAlister, SP; Kwong, DL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics