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公開日期標題作者
15-五月-2001Activation of p-type GaN in a pure oxygen ambientWen, TC; Lee, SC; Lee, WI; Chen, TY; Chan, SH; Tsang, JS; 電子物理學系; 友訊交大聯合研發中心; Department of Electrophysics; D Link NCTU Joint Res Ctr
2000Characteristics of optical properties of the interrupt growth method on InGaN/GaN MQW structuresLin, CF; Shu, CK; Lee, WH; Wen, TC; Chu, CF; Fang, JY; Chen, WK; Lee, WI; Wang, SC; 光電工程學系; Department of Photonics
1-三月-2001Characterization of p-type InxGa1-xN grown by metalorganic chemical vapor depositionWen, TC; Lee, WI; Sheu, JK; Chi, GC; 友訊交大聯合研發中心; D Link NCTU Joint Res Ctr
1-八月-1999A dopant-related defect in Te-doped AlInPWu, YR; Sung, WJ; Wen, TC; Lee, SC; Lee, WI; 電子物理學系; 友訊交大聯合研發中心; Department of Electrophysics; D Link NCTU Joint Res Ctr
1-九月-2001Influence of barrier growth temperature on the properties of InGaN/GaN quantum WellWen, TC; Lee, WI; 電子物理學系; 友訊交大聯合研發中心; Department of Electrophysics; D Link NCTU Joint Res Ctr
2001Influence of barrier growth temperature on the properties of InGaN/GaN quantum wellsWen, TC; Lee, SC; Lee, WI; 友訊交大聯合研發中心; D Link NCTU Joint Res Ctr
29-四月-2003Liquid phase deposited SiO2 on GaNWu, HR; Lee, KW; Nian, TB; Chou, DW; Wu, JJH; Wang, YH; Houng, MP; Sze, PW; Su, YK; Chang, SJ; Ho, CH; Chiang, CI; Chern, YT; Juang, FS; Wen, TC; Lee, WI; Chyi, JI; 電子物理學系; Department of Electrophysics
1-四月-2002Observation of dislocation etch pits in epitaxial lateral overgrowth GaN by wet etchingWen, TC; Lee, WI; Sheu, JK; Chi, GC; 電子物理學系; 資訊工程學系; Department of Electrophysics; Department of Computer Science
15-六月-2000Phosphorus vacancy as a deep level in AlInP layersSung, WJ; Wu, YR; Lee, SC; Wen, TC; Li, TJ; Chang, JT; Lee, WI; 友訊交大聯合研發中心; D Link NCTU Joint Res Ctr
1999Study of a common deep level in GaNWen, TC; Lee, SC; Lee, WI; Guo, JD; Feng, MS; 電子物理學系; Department of Electrophysics