標題: OHMIC CONTACT OF III-V SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME
作者: CHANG, Edward Yi
KUO, Chien-I
CHANG, Chun-Yen
公開日期: 21-四月-2011
摘要: Heavily doped epitaxial SiGe material or epitaxial InxGa1-xAs are used to form the source and drain of III-V semiconductor device to apply stress to the channel of III-V semiconductor device. Therefore, the electron mobility can be increased.
官方說明文件#: H01L029/778
H01L021/335
URI: http://hdl.handle.net/11536/105312
專利國: USA
專利號碼: 20110089467
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