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dc.contributor.authorCheng, Ching-Yunen_US
dc.contributor.authorChang, Ming-Hungen_US
dc.contributor.authorHwang, Weien_US
dc.date.accessioned2014-12-08T15:16:36Z-
dc.date.available2014-12-08T15:16:36Z-
dc.date.issued2007en_US
dc.identifier.isbn978-1-4244-0582-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/12257-
dc.identifier.urihttp://dx.doi.org/10.1109/ICICIC.2007.522en_US
dc.description.abstractIn this paper, we deploy power gating technique on a lowpower Pseudo SRAM circuit with 3TID gain cell. A 256word x 32-BL-pair 3TID gain cell array is implemented in standard logic technology with TSMC 0. l3urn model f6r multi-bank Pseudo SRAM. Each Pseudo SRAM has its independent access control unit, enabling parallel refresh and read-write accesses to different bank. By employing power gating technique in sense amplifier of 3TID gain cell array, 15% standby leakage current during sleep mode could be reduced. Also, 12% sensing speed could be enhanced when Pseudo SRAM is operated in normal mode (simulated with TSMC I 00nm technology model).en_US
dc.language.isoen_USen_US
dc.titlePower gating technique for embedded pseudo SRAMen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/ICICIC.2007.522en_US
dc.identifier.journal2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Proceedings of Technical Papersen_US
dc.citation.spage260en_US
dc.citation.epage263en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000247000000065-
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