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dc.contributor.authorHsu, Yungen_US
dc.contributor.authorFang, Xiangen_US
dc.contributor.authorWang, Lon A.en_US
dc.contributor.authorZan, Hsiao-Wenen_US
dc.contributor.authorMeng, Hsin-Feien_US
dc.contributor.authorYang, Sheng-Hsiungen_US
dc.date.accessioned2015-07-21T11:20:31Z-
dc.date.available2015-07-21T11:20:31Z-
dc.date.issued2014-12-01en_US
dc.identifier.issn1566-1199en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.orgel.2014.10.008en_US
dc.identifier.urihttp://hdl.handle.net/11536/124119-
dc.description.abstractWe introduced a conformal atomic-layer-deposited aluminum oxide layer to cover the imprint mold to reduce the feature size and to strengthen the mold durability. A nano-hole array pattern with diameter down to 85 nm was successfully transferred to sample substrate to fabricate a vertical organic transistor. The Imprint vertical organic transistor exhibited high output current density as 4.35 cm(2)/V s and high ON/OFF current ratio as 11,000 at a low operation voltage as 1.5 V. (C) 2014 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectNanoimprinten_US
dc.subjectAtomic layer deposition (ALD)en_US
dc.subjectVertical channelen_US
dc.subjectOrganic transistoren_US
dc.titleSub-100 nm ALD-assisted nanoimprint lithography for realizing vertical organic transistors with high ON/OFF ratio and high output currenten_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.orgel.2014.10.008en_US
dc.identifier.journalORGANIC ELECTRONICSen_US
dc.citation.volume15en_US
dc.citation.issue12en_US
dc.citation.spage3609en_US
dc.citation.epage3614en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.department物理研究所zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.contributor.departmentInstitute of Physicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000345649200028en_US
dc.citation.woscount1en_US
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