标题: A 45nm 6b/cell Charge-Trapping Flash Memory Using LDPC-Based ECC and Drift-Immune Soft-Sensing Engine
作者: Ho, Kin-Chu
Fang, Po-Chao
Li, Hsiang-Pang
Wang, Cheng-Yuan Michael
Chang, Hsie-Chia
交大名义发表
National Chiao Tung University
公开日期: 1-一月-2013
摘要: 
URI: http://hdl.handle.net/11536/129819
ISBN: 978-1-4673-4513-2; 978-1-4673-4515-6
ISSN: 0193-6530
期刊: 2013 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE DIGEST OF TECHNICAL PAPERS (ISSCC)
Volume: 56
起始页: 222
结束页: U1056
显示于类别:Conferences Paper