标题: | A 45nm 6b/cell Charge-Trapping Flash Memory Using LDPC-Based ECC and Drift-Immune Soft-Sensing Engine |
作者: | Ho, Kin-Chu Fang, Po-Chao Li, Hsiang-Pang Wang, Cheng-Yuan Michael Chang, Hsie-Chia 交大名义发表 National Chiao Tung University |
公开日期: | 1-一月-2013 |
摘要: | |
URI: | http://hdl.handle.net/11536/129819 |
ISBN: | 978-1-4673-4513-2; 978-1-4673-4515-6 |
ISSN: | 0193-6530 |
期刊: | 2013 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE DIGEST OF TECHNICAL PAPERS (ISSCC) |
Volume: | 56 |
起始页: | 222 |
结束页: | U1056 |
显示于类别: | Conferences Paper |