A 45nm 6b/cell Charge-Trapping Flash Memory Using LDPC-Based ECC and Drift-Immune Soft-Sensing Engine

標題:	A 45nm 6b/cell Charge-Trapping Flash Memory Using LDPC-Based ECC and Drift-Immune Soft-Sensing Engine
作者:	Ho, Kin-Chu Fang, Po-Chao Li, Hsiang-Pang Wang, Cheng-Yuan Michael Chang, Hsie-Chia 交大名義發表 National Chiao Tung University
公開日期:	1-一月-2013
摘要:
URI:	http://hdl.handle.net/11536/129819
ISBN:	978-1-4673-4513-2; 978-1-4673-4515-6
ISSN:	0193-6530
期刊:	2013 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE DIGEST OF TECHNICAL PAPERS (ISSCC)
Volume:	56
起始頁:	222
結束頁:	U1056
顯示於類別：	會議論文